We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for Structural analysis.
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Structural analysis Product List and Ranking from 36 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

Structural analysis Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

  1. アイテス Shiga//Electronic Components and Semiconductors
  2. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  3. テックインサイツジャパン株式会社（TechInsights） Tokyo//Service Industry
  4. 4 KRI Kyoto//Testing, Analysis and Measurement
  5. 5 null/null
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Structural analysis Product ranking

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

  1. Defective analysis of liquid crystal panels アイテス
  2. Structural (FEM) Analysis
  3. High-temperature and low-temperature Raman structural analysis KRI
  4. Report: Detailed Structural Analysis of the MDM9235 Modem Logic テックインサイツジャパン株式会社（TechInsights）
  5. 5 Collection of 4 books on improvement cases for substrate mounting and soldering defects!

Structural analysis Product List

1～15 item / All 81 items

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Defective analysis service

Defective analysis service

Introducing services that help improve product quality through various analytical methods and appropriate responses.

Our company provides detailed failure analysis services for various defects, including product samples from other companies. We conduct thorough investigations into the causes of defects using a wide range of analytical methods. By utilizing specialized material analysis techniques such as FTIR (Fourier Transform Infrared Spectroscopy), we can identify issues and defects related to the materials themselves. Additionally, we can utilize external facilities such as industrial testing laboratories as needed, allowing us to perform specialized analyses that cannot be handled by our in-house equipment. After discussing the details of your request and the condition of the product, we will focus our analysis on the areas where defects are most likely to occur. 【Service Examples】 ■ LED Product Analysis ■ Wire Bond Joint Analysis *For more details, please refer to the PDF document or feel free to contact us.

  • Analysis Services
  • Contract Analysis
  • Other analyses

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Refinement technology: separation refinement and structural analysis

Refinement technology: separation refinement and structural analysis

We also support the HPLC separation of optical active substances using chiral columns!

At the Nard Research Institute, we have been advancing the acquisition of manufacturing technologies and the expansion of separation and purification techniques and equipment in cutting-edge fields such as pharmaceuticals, electronic materials, automotive materials, and bio-related materials. Utilizing all the technologies and equipment we have cultivated so far, we not only support HPLC separation using silica gel, ODS, and GPC columns but also HPLC separation of optically active compounds using chiral columns. Additionally, we possess a mass-triggered HPLC separation device, allowing for the separation of trace components identified by mass spectrometry. The samples obtained through separation undergo structural analysis using analytical instruments such as NMR, LC/MS, GC/MS, and MALDI-TOF/MS, ultimately leading to the synthesis of estimated compounds and the identification and structural determination of unknown substances. 【Features】 ■ Supports HPLC separation of optically active compounds using chiral columns ■ Capable of separating trace components identified by mass spectrometry ■ Ultimately combines separated samples with the synthesis of estimated compounds for the identification and structural determination of unknown substances *For more details, please refer to the related link page or feel free to contact us.

  • others
  • Other contract services

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Structural Analysis Service

Structural Analysis Service

We will support your business promotion with analytical technology.

Our company has been a member of the UBE Group and Osaka Gas Group for approximately 40 years since its establishment, providing support for the design and troubleshooting of various equipment such as chemical plants and industrial machinery through our analytical technology. We will support your design operations with our proven structural analysis technology. For example... - Stress evaluation of newly designed equipment - Prompt investigation of the causes of equipment failure and verification of countermeasure effectiveness - Standard evaluations to obtain approvals from public institutions and customers - Consideration of business partners to address the shortage of CAE personnel Please feel free to consult with us.

  • Contract Analysis

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Structural analysis of nanomaterials

Structural analysis of nanomaterials

We offer contract services for structural analysis and morphological observation at the nanoscale.

We offer contract services for structural analysis and morphological observation of nanomaterials such as nanotubes using TEM, SEM, and EDS in the nanoscale region.

  • Contract measurement

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[Structural Analysis Example] Impact Analysis of a Rigid Sphere on a Protective Net

[Structural Analysis Example] Impact Analysis of a Rigid Sphere on a Protective Net

Modeling the net and support pillars to simulate the impact of a rigid sphere of falling rocks!

We will introduce a case study on the analysis of the strength and behavior of a protective net when it is impacted by falling rocks. It is possible to confirm not only the deformation of the net and the generated stress due to the impact of a rigid sphere but also the stress and deformation of the support posts caused by the net pulling on them. This analysis allows for the verification of the load-bearing capacity and failure behavior of the protective net, which can contribute to more optimal protective designs. [Analysis Results] - Confirmation of the deformation of the net and generated stress due to the impact of a rigid sphere, as well as the stress and deformation of the support posts caused by the net pulling on them. - Ability to verify the load-bearing capacity and failure behavior of the protective net. - Possible contribution to more optimal protective designs. *For more details, please refer to the related links or feel free to contact us.

  • Structural Analysis

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[Structural Analysis Example] Coupled Problem 1 Using Particle Method (SPH)

[Structural Analysis Example] Coupled Problem 1 Using Particle Method (SPH)

Modeled by the particle method (SPH)! The SPH water and Lagrange rotor blades apply contact conditions.

We will introduce a case study regarding "Bird Strike on Turbine Rotors." The properties of the bird are modeled as water using the Smoothed Particle Hydrodynamics (SPH) method. Contact conditions were applied between the SPH water and the Lagrangian rotor blades. In the related links below, we present the analysis results in images, so please take a look. 【Case Overview】 ■ SPH (Smoothed Particle Hydrodynamics) is suitable for analyzing fluid dispersion and large deformations. ■ The bird is modeled using the particle method (SPH). ■ The properties of the bird are modeled as water. ■ Contact conditions were applied between the SPH water and the Lagrangian rotor blades. *For more details, please refer to the related links or feel free to contact us.

  • Structural Analysis

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IC failure analysis

IC failure analysis

By combining various methods suitable for failure modes, we can consistently address everything from the identification of defective nodes to physical analysis.

We would like to introduce Aites Inc.'s "Defect Analysis of ICs." Our company provides a comprehensive approach to ICs by combining methods suitable for various defect modes, from identifying defective nodes to physical analysis. We offer various analysis techniques, including "Light Emission Analysis/OBIRCH Analysis," which allows layout verification using a Layout Viewer, as well as "Layer Delamination/Sample Processing," "PVC Analysis," "Diffusion Layer Etching," and "sMIM Analysis." 【Methods】 ■ Light Emission Analysis/OBIRCH Analysis ■ Layer Delamination/Sample Processing ■ Microprobe ■ PVC Analysis ■ EBAC Analysis ■ Physical Analysis (FIB-SEM, TEM) *For more details, please refer to the PDF document or feel free to contact us.

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  • Other analyses
  • Contract Analysis
  • Analysis Services

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Failure analysis of an orange LED damaged by electrostatic discharge.

Failure analysis of an orange LED damaged by electrostatic discharge.

We will introduce a comparison of brightness and characteristics between good products and ESD-damaged products, along with examples of luminescence analysis using EMS microscopy!

We conduct failure analysis of orange LEDs that have been damaged by electrostatic discharge (ESD). LEDs that have been destroyed in ESD testing and show a decrease in luminous intensity can be analyzed using emission luminescence and the IR-OBIRCH method, allowing us to clarify the failure phenomena. We have examples such as "Comparison of brightness and characteristics between good products and ESD-damaged products" and "Luminescence analysis using emission microscopy." [Analysis Examples] ■ Comparison of brightness and characteristics between good products and ESD-damaged products - By polishing the lens part of a bullet-type LED to flatten it, dark areas were observed during brightness comparison. ■ Luminescence analysis using emission microscopy - In ESD-damaged products, dark areas were observed under forward bias, while only the damaged areas emitted light under reverse bias. ■ IR-OBIRCH and SEI analysis - Detailed damage locations were identified through IR-OBIRCH analysis of ESD-damaged products. *For more details, please refer to the PDF document or feel free to contact us.

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  • Analysis Services
  • Contract Analysis

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Defective analysis of liquid crystal panels

Defective analysis of liquid crystal panels

We will narrow down the defective areas through lighting confirmation, panel disassembly, and optical microscope observation!

We provide a defect diagnosis menu for LCD panels, from confirming defects to identifying causes and conducting detailed failure analysis. In the initial analysis, we perform a status check (lighting test), panel disassembly, and optical microscope observation, tailored to the defect symptoms. In the detailed analysis, based on the diagnostic results from the initial analysis, we propose suitable methods such as surface analysis, cross-sectional analysis, and component analysis. It is also possible to speculate on the mechanisms of defect occurrence, including narrowing down the production processes that caused the defects. 【Analysis Content】 ■ Initial Analysis - Status check (lighting test), panel disassembly, optical microscope observation, conducted according to defect symptoms - Narrowing down from general areas such as cell panels and peripheral circuits to finer details ■ Detailed Analysis (additional analysis fees apply) - Based on the diagnostic results from the initial analysis, we propose suitable methods such as surface analysis, cross-sectional analysis, and component analysis - It is also possible to speculate on the mechanisms of defect occurrence, including narrowing down the production processes that caused the defects *For more details, please refer to the PDF document or feel free to contact us.

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  • Analysis Services
  • Contract Analysis

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Analysis of crystal grains below 30nm using the EBSD method.

Analysis of crystal grains below 30nm using the EBSD method.

EBSD: Electron Backscatter Diffraction

By conducting EBSD analysis on thinned samples, higher spatial resolution can be achieved compared to conventional bulk samples.

  • Contract Analysis

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[Analysis Case] Structural Analysis of Amorphous SiNx Films Using Molecular Dynamics Calculations

[Analysis Case] Structural Analysis of Amorphous SiNx Films Using Molecular Dynamics Calculations

Microscopic structural analysis of amorphous films is possible through simulation.

Amorphous SiNx (a-SiNx) films exhibit significant changes in physical properties from semiconductors to insulators due to compositional variations such as the N/Si ratio, making them suitable for a wide range of applications, including gate insulating films for transistors. On the other hand, experimental methods capable of atomic-level microscopic structural analysis for materials with non-crystalline amorphous structures are limited. Therefore, creating and analyzing amorphous structures with various compositions and densities through simulation becomes an effective tool. This document presents examples of structural analysis of a-SiNx films using molecular dynamics calculations.

  • Contract Analysis
  • Memory

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Structural analysis of paint fragments using a micro-infrared spectroscopic imaging system.

Structural analysis of paint fragments using a micro-infrared spectroscopic imaging system.

[Free Gift] Technical Documentation Using a Cutting-Edge Micro Infrared Spectroscopy Imaging System

Automotive paint is composed of multiple layers of paint to enhance weather resistance and aesthetic quality, with the layer structure and types of paint varying by vehicle model. Therefore, the component analysis of each layer that makes up a paint chip provides valuable information for identifying the vehicle model. This document presents case studies on the analysis of automotive paint chips conducted using a state-of-the-art micro-infrared spectroscopic imaging system. [Contents] ■ Introduction ■ Samples and Analysis System ■ Data Analysis ■ Results ■ Conclusion ■ References *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices

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Analysis of defective connector terminal contacts with Au plating【STEM/EDS】

Analysis of defective connector terminal contacts with Au plating【STEM/EDS】

It can be confirmed without loss by the "sampling method that protects the surface" of the adhered layer (approximately 20nm) on the surface of the connector terminal plated with STEM.

In STEM (Scanning Transmission Electron Microscopy) and EDS (Energy Dispersive X-ray Spectroscopy), information about the composition of the sample (contrast images reflecting atomic numbers) can be obtained by scanning a finely focused electron beam over the sample. The following features are also available: - Observation of changes in diffraction contrast by varying the angle of incidence of the electron beam - Determination of whether the observation target is crystalline - Acquisition of information about crystal defects (dislocations, twins, etc.) within the crystal In this case, we will introduce "Failure Analysis of Au-Plated Connector Terminal Contacts Using STEM." Please take a moment to read the PDF materials. Additionally, our company conducts various cross-sectional analyses using not only STEM but also TEM and SEM. We would be happy to assist you, so please feel free to reach out. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/ *Other materials are also available. If you request them through the inquiry button, we will send them to you.

  • Plating Equipment
  • Contract Analysis
  • Other metal materials

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